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  • 科学研究費補助金基盤研究(S)成果2009
  • 太陽電池・環境自然エネルギー寄付講座2006-2008

Equipment

HOME > Equipment

Materials Preparation

  • High-frequency vacuum dissolution equipment (Fuji Denpa Kogyo)
  • Crystal growth equipment (Daia Vacuum)
  • Electrical discharge plasma sintering device (Sumitomo Coal Mining Co., Ltd.)
  • Arc melting furnace
  • Vacuum Deposition Equipment UPC-260F (ULVAC)
  • Hot Pressing
  • High-frequency vacuum dissolution equipment
  • Crystal growth equipment
  • Electrical discharge plasma sintering device
  • Vacuum Deposition Equipment

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Materials Processing

  • Spark cutter (SANYO)
  • Multi-purpose lathe
  • Low-speed diamond cutter, Isomet (Buehler)
  • Vibratory polisher, Vibromet (Buehler)
  • Multi-purpose lathe

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Heat-treatment

  • Superconducting magnetic field heat-treatment system / 6T, 1500°C (Sumitomo Heavy Industry)
  • DC magnetic field heat-treatment system / 1.5T, 1200°C (Tamakawa / Thermo Riko)
  • AC magnetic field heat-treatment system / 60Hz, 0.5T, 1500°C (Denshijiki Industry / Thermo Riko)
  • Siliconite furnace / 1200°C
  • Tube furnace / 1100°C (Koyo Thermo Systems)
  • Superconducting magnetic field heat-treatment system
  • AC magnetic field heat-treatment system

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Microstructural analysis

  • Field Emission Scanning Eiectron Microscope, S-4200 (Hitachi)
    • OIM Automatic crystal orientation analysis system (TSL)
    • EDS analysis system (EDAX)
  • Field Emission Transmission Electron Microscope (shared), Tecnai F20(FEI)
  • Focused Ion Beam (shared), Quanta 3D 200i (FEI)
  • Erectron Probe Micro Analyzer, EPMA-1720H (Shimadzu)
  • Secondary Ion Mass Spectrometer (shared)
  • High-temperature microscope / 1500°C (Japan High Tech)
  • Kerr effect microscope (Olympus)
  • Optical microscope (Leica)
  • Optical microscope (Olympus)
  • Transmission Electron Microscope JEM-2000FX (JEOL)
  • FE-SEM
  • FE-TEM
  • FIB
  • EPMA
  • OM (Leica)
  • TEM

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Property evaluation

  • Vibrating sample magnetometer,VSM (Tamakawa)
  • Super high temperature all-purpose testing machine, AG-50kNG /50kN, 2000°C (Shimadzu / Sowa Kagaku)
  • High temperature creep testing machine (Shimadzu)
  • Scanning probe microscope, SPM9500J (Shimadzu)
    • Surface potential measurement system (Kelvin probe method)
    • Measurement system for local current
    • Measurement system for local thermal conductivity (μ-TA)
  • Ultraviolet photometer, UV-2400PC (Shimadzu)
  • Vickers hardness testing machine (AKASHI)
  • TriboIndenter, TI750 (HYSITRON)
  • Magnetic field differential scanning calorimeter
  • Vibrating sample magnetometer
  • Super high temperature all-purpose testing machine
  • High temperature creep testing machine
  • Scanning probe microscope
  • TriboIndenter
  • Magnetic field differential scanning calorimeter

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TEM sample preparation

  • Atom milling (Meiwafosis )
  • Tenupol (Marumoto-Struers)
  • Ion coater (Eiko)
  • Wire saw (Meiwafosis)
  • Ultrasound cutter (Meiwafosis)
  • Thin film making device and ion slicer (Japan Electron Optics Laboratory)
  • Precision Ion Polishing System (Gatan)
  • Thin film making device and ion slicer
  • Precision Ion Polishing System

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Miscellaneous

  • Electronic balance / 0.1mg (Sartorius)

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